M2 Wafer Edition

Wide bandgap SiC technology is opening up a whole new generation of high voltage power products for applications in transport, power transmission and green energy. M2 Wafer edition tests these upto 10kV on wafer before singulation, identifying defective product early and saving the expense of packaging underperforming die.

Ultra high voltage: Qualify and screen state‑of‑the‑art SiC 3.3kV+ devices at their full operating limit, ensuring accurate breakdown, leakage, and stress‑test results that correlate directly with their field applications.

Test with Confidence: testing power devices places significant demands on the tester hardware. Cosmic’s M2 platform is rugged and accurate, engineered for 24/7 operation in high volume production environments, ensuring high reliability and long time intervals between interventions. This increases test cell output and minimizes the demands on operators and maintenance teams.

Productivity: invest in the features you need today and add new capabilities later when your products evolve for quick return on investment.
M2 is a highly modular and expandable platform which can be reconfigured with new test hardware as your needs evolve.

M2 Flexible Edition is the perfect autometed test platform for testing a higher mix of product with fast reconfiguration in between, including MOSFETs, JFETs, IGBTs, transistors, silicon controlled rectifiers, bipolar devices, diodes, TRIACs and intelligent power devices.