Burn-in & HTOL Solution

Systems designed for Burn-in and High-Temperature Operating Life (HTOL) stress testing.

Used to identify early-life failures and validate long-term device reliability under controlled stress conditions.

ATE Portfolio Power Device Testing Mixed Signals Mems Solution Handlers Burn-in & HTOL Solution Accessories

DMT EVO

Quasar²⁰⁰
and Pulsar⁶⁰⁰

Viper

Vip Ultra

M2 Flexible Edition

HATINA GP

Ovenless Burn-In & HTOL solution

M2 Turret Edition

Hatina 4S

Celsius EVO

M2 Wafer Edition

Hatina WLBI

VIP Extended

FTI-1000 Lab

Wafer HV

Flexible Power

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