Flexible Power

Flexible final test for Si and GaN power products

Equipment

Up to 1.2 kV / 100 A • 8-Site Multisite • UIS & Gate Characterization Ready

FTI‑1000 Flexible Designed as a compact 8‑16 site solution for medium‑power Si and GaN devices, the FTI‑1000 Flexible delivers up to 1.2 kV and 100 A test capability within a low‑footprint architecture. Its adaptable design supports seamless integration with pick‑and‑place, gravity‑feed, and leadframe strip handlers, enabling rapid reconfiguration across diverse package types and workflows. It leverages modular Tester‑per‑Channel Board architecture to provide configurable AC and DC resources within a single scalable platform. Test development and debug are driven through FTI Studio, an intuitive graphical interface that makes advanced characterization accessible to both Designers and Test Engineers.

Reasons Why

Adaptable by design

Modular platform easily reconfigures for new device types and test requirements.

High throughput

Optimised test sequencing to reduce overall test time.

Operationally Efficient

Optimised test sequencing to reduce overall test time.

Product Presentation

FTI‑1000 Flexible is a compact, multi‑site ATE configuration designed for high‑mix testing of medium‑power Si and GaN discrete devices. Suitable for both engineering workflows and automated production, it integrates independent DC and AC resources capable of measuring key MOSFET parameters including DC characteristics, ΔVsd, gate charge, gate resistance, and inductive switching. Its 8‑site architecture delivers strong throughput while maintaining a small footprint, making it ideal for environments where rapid transitions between product lines are essential.
As part of the modular FTI‑1000 platform, the Flexible configuration supports plug‑in options such as high‑voltage extensions, high‑current pulse modules, digitizers, and Rg measurement capability. This scalability ensures that the system adapts easily to changing device portfolios without requiring extensive redesign or mechanical modification. Mechanical openness is a defining strength: the platform is compatible with a broad range of automated handling solutions—including pick‑and‑place, gravity‑feed, and leadframe strip handlers—while avoiding dependency on any specific mechanical format.
FTI Studio software enables efficient test‑program creation and debug through features such as waveform capture, automated data‑sheet generation, schmoo plotting, and parameter‑analysis tools. Together, this combination of multi‑site performance, adaptable hardware, and intuitive software creates a test solution that excels where flexibility, fast changeovers, and high throughput are essential—particularly in applications spanning automotive, industrial, and wide‑bandgap device development and production.

FEATURES

Flexible Power

Number of test sites
8-16
DC parametric test
Rdson, Idon, Vce(sat), Vgs, Gfs, Igss, Idss, BVdss, etc.
Gate oxide and quality
Rg, Cg, Qg
Thermal die-attach quality
dVsd/Vgs
UIS avalanche body diode quality
UIL, EAR, EAS

Dimensions

D⨯W⨯H
541mm ⨯ 345mm ⨯ 206mm
Power Supply: 345mm ⨯ 176mm ⨯ 103mm

Digital

Digital Channels
Option for 8 independent Digital Channels (IC Channel Board)

AC Source

Voltage
1.2kV
Current
100A
Short Circuit Current
>10J
Gate Voltage
+/-25V

Misc.

Gate Resistance
0,10,25,50 Ω , plus user pluggable R
Load Inductor
Pluggable discrete inductors or selectable inductor box

DC Source

Voltage
1.2kV
Current Drive Range (HV)
25mA
Current
100A

More info